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Rating monitoring as a means to mitigate rater effects and controversial evaluations

Authors: 
Mikel Villamañe
Mikel Larrañaga
Ainhoa Alvarez
Year: 
2017
ISBN: 
978-1-4503-5386-1
Conference name: 
Fifth International Conference on Technological Ecosystems for Enhancing Multiculturality (TEEM 2017)
Publishers: 
ACM
Editorial: 
ACM